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  1. DIGILEM - Interferometric Endpoint Detector & Thin Film Monitor

    Interferometry is a powerful technique that can be used for endpoint detection of planar layer and trench etching, or deposition
    plasma2
    semiconductor2
    semiconductors2
    deposition2
    etch1
    interference1
    Sofie1
    endpoint1
    interferometry1
    film thickness1
    interferometers1
    plasma etch1
    end point1
    dry etching1
    thickness monitors1
    dry etch1
    thin film characterisation1
    end point detection1
    endpoint detection1
    thin film measurements1
    deposition rate1
    end point detectors1
    endpointer1
    end pointer1
    end point systems1
    endpoint systems1
    etch rate1
    thin film monitors1
    Digilem0
    etching control0
    semiconductor characterisation0

    www.digilem.com - 2009-02-08

  2. John P Kummer - Semiconductor tools and materials

    The John P Kummer group supplies test, metrology, inspection and reliability & failure analysis tools and equipment to the European semiconductor industry.
    marketing6
    sales5
    inspection3
    measurement2
    handling2
    semiconductor2
    calibration2
    reliability2
    geometry2
    metrology2
    wafer1
    overlay1
    sorting1
    analyzers1
    flow switches1
    characterisation1
    probe cards1
    ion sources1
    decapsulation1
    thin film characterisation1
    ion-assisted deposition1
    linewidth measurement1
    electromigration testing0
    hot carrier degradation0
    load board testing0
    probe card analysis0
    probe card testing0
    standards package0
    tddb c-v measeurements0
    wafer edge inspection0
    water flow sensing0

    www.jpkummer.com - 2009-02-06

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